Publication:

Dielectric reliability of 50nm 1/2 pitch structures in Aurora® LK

Date

2008
Proceedings Paper
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Author(s)

Demuynck, Steven  
;
Kim, Hongun
;
Huffman, Craig
;
Darnon, Maxime
;
Struyf, Herbert  
;
Versluijs, Janko  
;
Claes, Martine  
;
Vereecke, Guy  
;
Volders, Henny  
;
Heylen, Nancy  
;
Kellens, Kristof  
;
Beyer, Gerald  

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1936 since deposited on 2021-10-17
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Acq. date: 2026-08-20

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