Publication:
De-process and physical characterization of HfO2 based resistive memory as studied by C-AFM
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1935 since deposited on 2021-10-20
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Acq. date: 2026-08-20
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Statistics
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1935 since deposited on 2021-10-20
4last month
3last week
Acq. date: 2026-08-20
Citations