Publication:
Temperature and frequency dependent electrical characterization of HfO2/InxGa1xAs interfaces using capacitance-voltage and conductance methods
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1966 since deposited on 2021-10-18
2last month
Acq. date: 2026-08-20
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Statistics
Views
1966 since deposited on 2021-10-18
2last month
Acq. date: 2026-08-20
Citations