Publication:

The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs

Date

2022
Journal article
https://doi.org/10.1109/led.2022.3206610
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Author(s)

Millesimo, M.
;
Borga, Matteo  
;
Bakeroot, Benoit  
;
Posthuma, Niels  
;
Decoutere, Stefaan  
;
Sangiorgi, E.
;
Fiegna, C.
;
Tallarico, A. N.

Journal

IEEE ELECTRON DEVICE LETTERS

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