Publication:
Deep level assessment of n-type Si/SiO2 metal-oxide-semiconductor capacitors with embedded Ge quantum dots
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1934 since deposited on 2021-10-24
3last month
1last week
Acq. date: 2026-10-13
Citations
Statistics
Views
1934 since deposited on 2021-10-24
3last month
1last week
Acq. date: 2026-10-13
Citations