Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

Lee, Kookjin; Nam, Sangjin; Ji, Hyunjin; Choi, Junhee; Jin, Jun-Eon; Kim, Yeonsu; Na, Junhong; Ryu, Min-Yeul; Cho, Young-Hoon; Lee, Hyebin; Lee, Jaewoo; Joo, Min-Kyu; Kim, Gyu-Tae

doi:10.1038/s41699-020-00186-w

Publication:

Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

Date

2021

Journal article

https://doi.org/10.1038/s41699-020-00186-w

Simple item page Full metadata Statistics

Files

Published version 2.18 MB

Author(s)

;

;

;

;

;

;

;

;

;

;

;

;

Journal

NPJ 2D MATERIALS AND APPLICATIONS

Statistics

442 since deposited on 2022-02-23

29last month

9last week

Acq. date: 2026-08-14

1996 since deposited on 2022-02-23

Acq. date: 2026-08-14

Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

Date

Files

Author(s)

Journal

Abstract

Description

Statistics

Downloads

Views

Citations

Statistics

Downloads

Views

Citations