Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

Lee, Kookjin; Nam, Sangjin; Ji, Hyunjin; Choi, Junhee; Jin, Jun-Eon; Kim, Yeonsu; Na, Junhong; Ryu, Min-Yeul; Cho, Young-Hoon; Lee, Hyebin; Lee, Jaewoo; Joo, Min-Kyu; Kim, Gyu-Tae

doi:10.1038/s41699-020-00186-w

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Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

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2021

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https://doi.org/10.1038/s41699-020-00186-w

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NPJ 2D MATERIALS AND APPLICATIONS

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Acq. date: 2026-10-13

1998 since deposited on 2022-02-23

Acq. date: 2026-10-13

Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

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