Publication:

Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Date

2024
Journal article
https://doi.org/10.1088/1361-6528/ad3aff
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Author(s)

Hoenicke, Philipp
;
Waehlisch, Andre
;
Unterumsberger, Rainer
;
Beckhoff, Burkhard
;
Bogdanowicz, Janusz  
;
Charley, Anne-Laure  
;
Mertens, Hans  
;
Rochat, Nevine
;
Hartmann, Jean-Michel
;
Giambacorti, Narciso

Journal

NANOTECHNOLOGY

Abstract

Description

Statistics

Downloads

141 since deposited on 2024-05-03
26last month
10last week
Acq. date: 2026-10-13

Views

545 since deposited on 2024-05-03
2last month
Acq. date: 2026-10-13

Citations

Statistics

Downloads

141 since deposited on 2024-05-03
26last month
10last week
Acq. date: 2026-10-13

Views

545 since deposited on 2024-05-03
2last month
Acq. date: 2026-10-13

Citations