Publication:

Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Date

2024-JUL 8
Journal article
https://doi.org/10.1088/1361-6528/ad3aff
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Author(s)

Hoenicke, Philipp
;
Waehlisch, Andre
;
Unterumsberger, Rainer
;
Beckhoff, Burkhard
;
Bogdanowicz, Janusz  
;
Charley, Anne-Laure  
;
Mertens, Hans  
;
Rochat, Nevine
;
Hartmann, Jean-Michel
;
Giambacorti, Narciso

Journal

NANOTECHNOLOGY

Abstract

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