Publication:
Statistical Poly-Si grain boundary model with discrete charging defects and its 2D and 3D implementation for vertical 3D NAND channels
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1894 since deposited on 2021-10-22
1last month
Acq. date: 2026-06-03
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Statistics
Views
1894 since deposited on 2021-10-22
1last month
Acq. date: 2026-06-03
Citations