Publication:

Unveiling the Vulnerability of Oxide-Breakdown-Based PUF

Date

2024

Journal article

https://doi.org/10.1109/led.2024.3369860

Simple item page Full metadata Statistics

Author(s)

Saraza Canflanca, Pablo

;

;

Diaz Fortuny, Javier

;

;

Degraeve, Robin

;

;

Verbauwhede, I.

;

Journal

IEEE ELECTRON DEVICE LETTERS

Statistics

606 since deposited on 2024-06-08

4last month

Acq. date: 2026-08-19