Publication:

Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions

Date

2022

Proceedings Paper

https://doi.org/10.1109/iirw56459.2022.10032756

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Author(s)

Sangani, Dishant

;

Diaz Fortuny, Javier

;

;

;

Journal

na

Statistics

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Acq. date: 2026-08-21