Publication:

Preliminary reliability assessment of GaN-on-Si HEMT using in-situ Si3N4 cap layer

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1920 since deposited on 2021-10-17
3last month
Acq. date: 2026-08-18

Citations

Statistics

Views

1920 since deposited on 2021-10-17
3last month
Acq. date: 2026-08-18

Citations