Publication:
Preliminary reliability assessment of GaN-on-Si HEMT using in-situ Si3N4 cap layer
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1917 since deposited on 2021-10-17
1last month
Acq. date: 2026-06-03
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Statistics
Views
1917 since deposited on 2021-10-17
1last month
Acq. date: 2026-06-03
Citations