Publication:

Assessment of Ge1-xSnx alloys for strained Ge CMOS devices

Date

2010

Proceedings Paper

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Files

20943.pdf 644.59 KB

Author(s)

Takeuchi, Shotaro

;

Shimura, Yosuke

;

Nishimura, Tsuyoshi

;

Vincent, Benjamin

;

;

Clarysse, Trudo

;

Demeulemeester, Jelle

;

Temst, Kristiaan

;

Vantomme, Andre

;

Dekoster, Johan

;

;

;

Nakatsuka, Osamu

;

;

Zaima, Shigeaki

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Acq. date: 2026-10-12