Publication:
Implications of inelastic tunneling on the depth of oxide traps in MOSFETs assessed by RTS or BTI
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1843 since deposited on 2021-10-22
1last month
Acq. date: 2026-05-30
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Statistics
Views
1843 since deposited on 2021-10-22
1last month
Acq. date: 2026-05-30
Citations