Publication:
Assessment of EUV resist performance for sub-22nm hp lines and 26nm hp contacts on NXE3100
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2070 since deposited on 2021-10-20
17last month
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Acq. date: 2026-10-12
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Statistics
Views
2070 since deposited on 2021-10-20
17last month
8last week
Acq. date: 2026-10-12
Citations