Publication:
Experimental study of programming saturation in low-coupling planar high-k/metal gate Nand flash memory cells using a dedicated test structure
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1939 since deposited on 2021-10-22
2last month
Acq. date: 2026-08-16
Citations
Statistics
Views
1939 since deposited on 2021-10-22
2last month
Acq. date: 2026-08-16
Citations