Electrical defects in dielectrics for flash memories studied by Trap Spectroscopy by Charge Injection and Sensing (TSCIC)

Publication:

2009

Proceedings Paper

Author(s)

Degraeve, Robin

;

Cho, Moon Ju

;

Govoreanu, Bogdan

;

;

Zahid, Mohammed

;

;

;

;

1890 since deposited on 2021-10-17

1last month

Acq. date: 2026-10-13