Publication:

Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs

Date

2021

Proceedings Paper

https://doi.org/10.1109/irps46558.2021.9405162

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Author(s)

Chang, Hao

;

Zhou, Longda

;

Yang, Hong

;

Ji, Zhigang

;

Liu, Qianqian

;

;

Yin, Huaxiang

;

Wang, Wenwu

Journal

na

Statistics

1650 since deposited on 2021-11-02

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Acq. date: 2026-08-15