Publication:

Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis

Date

2024
Journal article
https://doi.org/10.1109/ted.2024.3351598
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Author(s)

Asanovski, R.
;
Arimura, Hiroaki  
;
de Marneffe, Jean-Francois  
;
Palestri, P.
;
Horiguchi, Naoto  
;
Kaczer, Ben  
;
Selmi, L.
;
Franco, Jacopo  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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431 since deposited on 2024-02-06
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507 since deposited on 2024-02-06
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Acq. date: 2026-10-12

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