Publication:
Anisotropic stress in narrow sGe fin field-effect transistor channels measured using nano-focused Raman spectroscopy
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1943 since deposited on 2021-10-26
2last month
Acq. date: 2026-08-14
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Statistics
Views
1943 since deposited on 2021-10-26
2last month
Acq. date: 2026-08-14
Citations