Publication:

TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs

Date

2022
Journal article
https://doi.org/10.1109/ted.2021.3134928
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Author(s)

Tallarico, A. N.
;
Millesimo, M.
;
Bakeroot, Benoit  
;
Borga, Matteo  
;
Posthuma, Niels  
;
Decoutere, Stefaan  
;
Sangiorgi, E.
;
Fiegna, C.

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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2818 since deposited on 2022-01-01
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2026 since deposited on 2022-01-01
3last month
Acq. date: 2026-08-16

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