Publication:

Next generation FinFET devices in bulk silicon technology and their benefits for ESD robustness

Date

2009

Proceedings Paper

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Author(s)

Griffoni, Alessio

;

;

Russ, Christian

;

Tremouilles, David

;

Linten, Dimitri

;

;

Collaert, Nadine

;

Witters, Liesbeth

;

Meneghesso, Gaudenzio

;

Groeseneken, Guido

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Acq. date: 2026-05-30