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Reliability screening oh high-k dielectrics based on voltage ramp stress
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Acq. date: 2026-10-12
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Acq. date: 2026-10-12
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6 since deposited on 2021-10-16
Acq. date: 2026-10-12
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1961 since deposited on 2021-10-16
3last month
Acq. date: 2026-10-12
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