Publication:

Metrology for implanted Si substrate loss studies

Date

2010
Journal article
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20899.pdf 484.96 KB

Author(s)

Radisic, Dunja  
;
Shamiryan, Denis
;
Mannaert, Geert  
;
Boullart, Werner  
;
Rosseel, Erik  
;
Bogdanowicz, Janusz  
;
Goossens, Jozefien
;
Marrant, Koen
;
Bender, Hugo  
;
Sonnemans, Roger
;
Berry, Ivan

Journal

Journal of the Electrochemical Society

Abstract

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