Publication:
Modelling hot carrier degradation of LDD NMOSFETs by using a high resolution measurement technique
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2055 since deposited on 2021-10-06
2last month
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Acq. date: 2026-08-15
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Statistics
Views
2055 since deposited on 2021-10-06
2last month
1last week
Acq. date: 2026-08-15
Citations