Publication:
Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Downloads
1 since deposited on 2021-10-17
Acq. date: 2026-10-13
Views
1872 since deposited on 2021-10-17
Acq. date: 2026-10-13
Citations
Statistics
Downloads
1 since deposited on 2021-10-17
Acq. date: 2026-10-13
Views
1872 since deposited on 2021-10-17
Acq. date: 2026-10-13
Citations