Publication:

Development and analysis of thick GaN drift layers on 200 mm CTE-matched substrate for vertical device processing

Date

2023
Journal article
https://doi.org/10.1038/s41598-023-42747-1
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Author(s)

Filho Goncalez, Walter  
;
Borga, Matteo  
;
Geens, Karen  
;
Cingu, Deepthi  
;
Chatterjee, Urmimala  
;
Banerjee, Sourish  
;
Vohra, Anurag  
;
Han, Han  
;
Minj, Albert  
;
Hahn, Herwig
;
Marx, Matthias
;
Fahle, Dirk
;
Bakeroot, Benoit  
;
Decoutere, Stefaan  

Journal

SCIENTIFIC REPORTS

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296 since deposited on 2023-11-19
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