Publication:

Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs

Date

2022

Proceedings Paper

https://doi.org/10.1109/irps48227.2022.9764600

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

;

Bakeroot, Benoit

;

;

Decoutere, Stefaan

;

;

;

Journal

na

Statistics

1298 since deposited on 2023-02-27

4last month

1last week

Acq. date: 2026-10-13