Publication:

Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1973 since deposited on 2021-10-27
2last month
Acq. date: 2026-10-13

Citations

Statistics

Views

1973 since deposited on 2021-10-27
2last month
Acq. date: 2026-10-13

Citations