Publication:
Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
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Acq. date: 2026-08-17
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365 since deposited on 2021-11-02
58last month
11last week
Acq. date: 2026-08-17
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1936 since deposited on 2021-11-02
Acq. date: 2026-08-17
Citations