Publication:

Modeling impact of electric field and strain on the leakage of embedded SiGe source/drain junctions

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1910 since deposited on 2021-10-18
2last month
2last week
Acq. date: 2026-08-20

Citations

Statistics

Views

1910 since deposited on 2021-10-18
2last month
2last week
Acq. date: 2026-08-20

Citations