Publication:

A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays

Date

2023

Proceedings Paper

https://doi.org/10.1109/edtm55494.2023.10102937

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Author(s)

Grill, Alexander

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Diaz Fortuny, Javier

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Beckers, Arnout

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;

Vaisman Chasin, Adrian

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De Greve, Kristiaan

Journal

7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM)

Statistics

1026 since deposited on 2023-09-03

2last month

Acq. date: 2026-08-18