Publication:

Electrical and DLTS Characterization of Gate Interfaces in GaN-based Trench-gate semi-vertical MOS devices

Date

2020

Proceedings Paper

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Author(s)

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Mikoláek, Miroslav

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Decoutere, Stefaan

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Stuchlíková, Lubica

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1973 since deposited on 2021-10-29

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Acq. date: 2026-08-17