Publication:
Instability and defects in gate dielectric: similarity and differences between Hf-stacks and SiO2
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1878 since deposited on 2021-10-16
4last month
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Acq. date: 2026-08-16
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Statistics
Views
1878 since deposited on 2021-10-16
4last month
3last week
Acq. date: 2026-08-16
Citations