Publication:
Dynamics of threshold voltage instability in stacked high-k dielectrics: role of the interfacial oxide
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2092 since deposited on 2021-10-15
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Acq. date: 2026-10-12
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Statistics
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2092 since deposited on 2021-10-15
1last month
1last week
Acq. date: 2026-10-12
Citations