Publication:
Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale
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1939 since deposited on 2021-10-21
1last month
Acq. date: 2026-08-14
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Statistics
Views
1939 since deposited on 2021-10-21
1last month
Acq. date: 2026-08-14
Citations