Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETs

Publication:

2004

Journal article

Author(s)

;

;

;

;

;

;

;

IEEE Trans. Nuclear Science

2038 since deposited on 2021-10-15

2last month

Acq. date: 2026-08-18