Publication:

Breakdown investigation in GaN-based MIS-HEMT devices

Date

2014

Proceedings Paper

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Author(s)

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Meneghini, Matteo

;

Verzellesi, Giovanni

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Van Hove, Marleen

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Decoutere, Stefaan

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;

Stoffels, Steve

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Meneghesso, Gaudio

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2003 since deposited on 2021-10-22

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Acq. date: 2026-08-16