Publication:
Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs
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Acq. date: 2026-06-06
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Acq. date: 2026-06-06
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1 since deposited on 2021-10-20
Acq. date: 2026-06-06
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1916 since deposited on 2021-10-20
1last month
Acq. date: 2026-06-06
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