Publication:

Fundamental understanding of NBTI degradation mechanism in IGZO channel devices

Date

2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529352
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Accepted version 1.71 MB

Author(s)

Zhao, Ying  
;
Rinaudo, Pietro  
;
Vaisman Chasin, Adrian  
;
Truijen, Brecht  
;
Kaczer, Ben  
;
Rassoul, Nouredine  
;
Dekkers, Harold  
;
Belmonte, Attilio  
;
De Wolf, Ingrid  
;
Kar, Gouri Sankar  
;
Franco, Jacopo  

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N/A

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