Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs

Publication:

2023

Journal article

Author(s)

Luo, Xuyi

;

Zhang, En Xia

;

Wang, Peng Fei

;

Li, Kan

;

;

;

Reed, Robert A.

;

Fleetwood, Daniel M.

;

Schrimpf, Ronald D.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

1284 since deposited on 2023-05-07

Acq. date: 2026-08-14