Publication:

Effect of Si surface roughness on the current-voltage characteristics of ultra-thin gate oxides

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1929 since deposited on 2021-09-30
3last month
1last week
Acq. date: 2026-10-13

Citations

Statistics

Views

1929 since deposited on 2021-09-30
3last month
1last week
Acq. date: 2026-10-13

Citations