Publication:
A MOS capacitor model for ultra-thin 2D semiconductors: the impact of interface defects and channel resistance
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1995 since deposited on 2021-10-28
1last month
Acq. date: 2026-06-02
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Statistics
Views
1995 since deposited on 2021-10-28
1last month
Acq. date: 2026-06-02
Citations