Publication:

Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions

Date

2022
Proceedings Paper
https://doi.org/10.1109/iedm45625.2022.10019489
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Author(s)

Yu, Hao  
;
Parvais, Bertrand  
;
Peralagu, Uthayasankaran  
;
ElKashlan, Rana Y.  
;
Rodriguez, Raul  
;
Khaled, Ahmad  
;
Yadav, Sachin  
;
Alian, AliReza  
;
Zhao, Ming  
;
Braga, N. de Almeida
;
Cobb, J.
;
Fang, J.
;
Cardinael, Pieter  
;
Sibaja-Hernandez, Arturo  
;
Collaert, Nadine  

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na

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