Publication:
Low-frequency noise analysis of the impact of an LaO cap layer in HfSiON/Ta2C gate stack nMOSFETs
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1945 since deposited on 2021-10-18
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Acq. date: 2026-10-12
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1945 since deposited on 2021-10-18
1last month
1last week
Acq. date: 2026-10-12
Citations