Publication:
Modeling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance
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1917 since deposited on 2021-10-15
3last month
Acq. date: 2026-10-13
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Statistics
Views
1917 since deposited on 2021-10-15
3last month
Acq. date: 2026-10-13
Citations