Publication:

Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs

Date

2010

Proceedings Paper

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Author(s)

Zhang, Cher Xuan

;

;

Fleetwood, Dan M.

;

Schrimpf, Ronald D

;

Galloway, Kenneth F.

;

;

;

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Acq. date: 2026-08-14