Publication:
Understanding of the hot-carrier degradation in submicron MOSFET's : from uniform injection towards the real operating conditions
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2028 since deposited on 2021-09-29
2last month
Acq. date: 2026-05-30
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Views
2028 since deposited on 2021-09-29
2last month
Acq. date: 2026-05-30
Citations