Publication:

Physical failure analysis to distinguish EOS and ESD failures

Date

2002

Proceedings Paper

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Files

6464.pdf 1.33 MB

Author(s)

Tung, Chih Hang

;

Cheng, Cheng Kou

;

Radhakrishnan, M.K.

;

Mahadeva Iyer, Natarajan

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1921 since deposited on 2021-10-14

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Acq. date: 2026-06-03