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Wideband measurement system for on-chip ESD waveform characterisation
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Wideband measurement system for on-chip ESD waveform characterisation
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Colman, G.
;
Bauwelinck, Johan
;
Gillon, R.
;
Wieers, A.
;
Vandewege, Jan
Journal
Electronics Letters
Abstract
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Acq. date: 2026-08-18
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Views
1888
since deposited on 2021-10-20
2
last month
Acq. date: 2026-08-18
Citations