Publication:
A comprehensive reliability investigation of the voltage-, temperature- and device geometry-dependence of the gate degradation on state-of-the-art GaN-on-Si HEMTs
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1991 since deposited on 2021-10-18
3last month
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Acq. date: 2026-10-13
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Statistics
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1991 since deposited on 2021-10-18
3last month
2last week
Acq. date: 2026-10-13
Citations